Nuova Officina Assergi: the inNOvAtive facility for the production of large area Silicon photodetectors

Sep 19, 2025, 9:35 AM
20m
Ketteler-Saal

Ketteler-Saal

Talk Technological aspects and applications of Cherenkov light detectors Technological aspects and applications of Cherenkov light detectors

Speaker

Andrea Marasciulli (INFN-LNGS)

Description

Nuova Officina Assergi (NOA) is a novel semiconductor facility located at INFN Laboratori Nazionali del Gran Sasso (LNGS) and operational since the beginning of 2023. According to the ISO-14644-1 standard, it has been classified an ISO-6 clean room and it extends over a surface of 420 m2. The infrastructure is divided in two experimental areas with a reduced radon concentration. A larger portion of 350 m2 has been conceived to assemble and test large arrays of Silicon-based devices operated down to cryogenic temperature. A smaller area of 70 m2 but with a more sided ceiling has been devoted to the integration of large volume detectors. The assembly area houses cutting-edge technology packaging machines: an automatic cryogenic wafer probe station, a semi-automatic dicing system with a set of semiconductor assembly tools, a high-speed dual head die flip-chip bonder and a fully automatic fine wire bonder. Furthermore several dedicated customized set ups and instrumentation for testing and qualifying the photosensor modules with the related electronics are a significant part of the equipment. Currently NOA is fully committed to the mass production of 600 Photo Detection Units (20 cm x 20 cm) for the DarkSide-20k experiment that will be documented in this context. This achievement would represent an important milestone for the DarkSide-20k collaboration but also would open new frontiers for future synergies between LNGS and other collaborations interested to adoperate such technologies.
The NOA clean room has been also designed to be compatible with the installation of a Radon abatement system that in perspective would provide the opportunity to perform the packaging and test operations in a Radon free environment.

Author

Co-author

Lucia Consiglio (INFN LNGS)

Presentation materials