Sprecher
Beschreibung
M. Tatsch$^1$, B. M. Döhring$^{1, 2}$, K. Huber$^1$, S. Schippers$^{1,2}$
$^1$I. Physikalisches Institut, Justs-Liebig-Universität Gießen, Germany
$^2$Helmholtz Research Academy Hesse for FAIR (HFHF)
The Giessen ion source test bench is an apparatus designed to facilitate an easy adaption to a variety of different ion sources and to provide straightforward control and operation. Therefore, reliable and easy operation was the main focus, so the number of ion-optical components is reduced to the minimum. The test bench consists of an extraction and einzel-lens system, which is adaptable to the dedicated ion source. A pair of two double-plate capacitors permits the ion beam shift in vertical and horizontal direction. A double-focusing mass analyzing bending magnet with four-jaw slits at both focal points follows.
For recording mass spectra with an accuracy for isotope isolation, the ion current is measured in two Faraday cups: one in front and one behind the magnet. The ion current measurement is realized with an in-house developed amperemeter capable of measuring currents between 1 pA and 100 µA.
The test bench is currently under modification to be able to perform performance tests of a new 14.5 GHz ECR ion source as a preparation for commissioning the source at PIPE@P04 at DESY, Hamburg. To achieve this, we have set up the in-house ion current measurement system and established the control of the magnet power supply to record mass spectra. Since the new ECR provides mass-flow controllers as the gas-inlet system, we will be able to determine the ionisation efficiency and find the optimal settings for the new source.
We will report on the experimental setup of the ion source test bench and the steps taken to adapt it to our new ECR source.
