Sprecher
Beschreibung
We present experimental results from the HHT experimental area at GSI, demonstrating a robust method for single-shot focal spot characterization of the SIS18 heavy ion beam (238 U73+, 300 MeV/u).
The diagnostic setup utilized a Si (444) spherically bent crystal spectrometer coupled with a CCD camera to record the Cu K-alpha emission (8.048 keV) induced by the ion interaction with a thick copper target. This monochromatic imaging technique allowed for the reconstruction of the 2D spatial profile of the beam interaction zone, effectively filtering out of other signals (e.g. the Bremsstrahlung background).
We successfully resolved the beam focal spot geometry in a single-shot mode. The obtained results were compared with complementary diagnostics, including Optical Transition Radiation (OTR) and ion-induced fluorescence in Argon gas. The presented diagnostic scheme offers a reliable non-distractive tool for on-shot ion beam monitoring in future FAIR-phase experiments.
