Holger Flemming welcomed the attendees to the FEE session. In a short
introduction he reported that now a mailing list PANDA-FEE@gsi.de was
set up for better communication of FEE developers in PANDA. It came the
proposal to send a mail to all PANDA members to advert to this mailing list.

After the introduction four presentation were given.

1. M. Traxler: The CBM/HADES/PANDA-DiRICH Project and Experiences with the Series Production

First Michael presented the DiRICH project which is a common development
for PANDA DIRC, CBM RICh and HADES RICH. Then he gave an inside into
some design issues and problems occurred during series production.

To avoid DC-DC converters which might interfere with the very sensitive
front ends it was decided to use external DC supplies. So at HADES a
1000A @ 1.1V supply was realised an came out to be doable.

A critical point was PCB production. The production of demanding PCB
with buried and stacked micro vias might be fine for prototypes but
several suppliers denied series production due to a very low yield.
One should always keep in mind delivery times and delays due to the
tendering process. So one should plan at least one year for the whole
production process.

2. C. Motzko: Radiation Hardness of electronic components of the Luminosity detector

Christof reported on the irradiation of electronics components with
protons at COSY. Different standard components like LDO regulators, LVDS
repeater, clock driver and micro-controller were irradiated. Components
which stand the expected dose at the LMD were identified while others
get broken. In the future the tests will be repeated with a larger
sample and with neutrons

3. P. Wieczorek: Measurement Results of a Large Dynamic Range CSA

During the last FEE workshop in May Peter presented the concept of a
charge sensitive amplifier with a switchable feedback capacitance. The
feedback capacitance can be dynamically increased to expand the dynamic
range of the amplifier. In this session Peter showed measurement results
of the amplifier. With a noise level of 0.38 fC (2370e) the amplifier
can cope with 42 pC.

4. C. Hahn: Status of the SerialAdapter ASIC tests

At the beginning Christopher introduces the SerialAdapter ASIC which is
foreseen to connect different serial busses inside the barrel EMC. In
addition the ASIC contains 8 DACs for the high voltage regulation.
While the digital communication works perfectly the DACs show large non
linearities. The reason for these non linearities is currently under
discussion.